Wafers, Photomasks, TFT-LCDs, Quartz, SiC, Sapphire, etc.
x = 50 mm, y = 230 mm, = 360 deg.
Stereoscope with a zoom lens
(×15~× 90)
(High Mag. Type: ×45~×280)
CCD camera with a zoom lens
(×25~×150 on a 19 inch monitor)
CCD camera with a zoom lens
(×90~×580 on a 19 inch monitor)
with a double light guide
Coaxial consisting of white LEDs
AC 100 V, ≤200W, 50/ 60 Hz
Cross-Sectional SEM
image of mask glass
Warranty: 1 year
Custom Specifications are available by request.
Specifications are subject to change without notice.
“AMC-series” solves your problems on preparations of
Cross-Sectional SEM specimens. No need to waste your time!
Simple operations
Adjust→Teach→Scribe (Auto.)→Split
The target is skipped and never damaged.
CPU aided control of scribing (JPN Patent no. 3361024)
AMC scribes both flat and curved specimens.
e. g. AMC can split glass (9 mm thick) smooth.
With pliers ABK-5: Aluminum Arm Type
(for specimens > 5 mm thick)
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